Safemem

References:

  • Qin, Feng, Shan Lu, and Yuanyuan Zhou. “SafeMem: Exploiting ECC-memory for detecting memory leaks and memory corruption during production runs.” 11th International Symposium on High-Performance Computer Architecture. IEEE, 2005.

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Created Jan 17, 2022 // Last Updated Jan 18, 2022

If you could revise
the fundmental principles of
computer system design
to improve security...

... what would you change?